Nikon STORM Super-Resolution Microscope

                                        STORM_instrument_392x180     STORM_181x180

Nikon N-STORM super-resolution microscope system consisting of a Nikon Ti-E TIRF inverted microscope base with laser modules delivering excitation at 405 nm, 488 nm, 561 nm, and 647 nm, and a high sensitivity Andor iXON3 DU897 EMCCD camera. This instrument provides resolution in the fluorescence mode of 20 nm lateral and 50 nm axial. Both fixed and live cell preparations can be imaged, as well as imaging in three dimensions.

Papers published from the MIC:

Additional papers.